SUMMARY

The manufacture of lattice geometries via additive manufacturing has the potential to impact the production of low-volume, high cost, complex components. However, the qualification of lattice geometries provides several challenges for traditional metrological techniques, limiting the use of these structures within industry. While recent studies in AM part qualification have improved its practice, the uncertainty in the measurement of lattice structures unique to additive manufacturing is not well understood and methods to support traceability have yet to be developed. The proposed study will focus on three key objectives: 1) Construction, validation, and evaluation of a framework to reduce variation in the registration of data from multiple measurement sources for geometric evaluation, 2) Design and analysis of a calibrated artifact for use in process measurement uncertainty identification for computed tomography, 3) Development of generalized methods for transfer of uncertainty from qualified reference features to the lattice structure. This study will provide a rigorous methodology to determine measurement uncertainty in the qualification of a lattice component, will further the scientific understanding XCT measurements of AM components, and will lay the groundwork for further implementation of the presented method.